Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, T. M. Mak. Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models. In Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003. pages 668-673, ACM, 2003. [doi]
Abstract is missing.