Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger. On Hazard-free Patterns for Fine-delay Fault Testing. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 213-222, IEEE, 2004. [doi]
Abstract is missing.