Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits

Norio Kuji. Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 174, IEEE Computer Society, 1997. [doi]

Authors

Norio Kuji

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