Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits

Norio Kuji. Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 174, IEEE Computer Society, 1997. [doi]

Abstract

Abstract is missing.