Norio Kuji. Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 174, IEEE Computer Society, 1997. [doi]
@inproceedings{Kuji97,
title = {Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits},
author = {Norio Kuji},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090174abs.htm},
tags = {macros},
researchr = {https://researchr.org/publication/Kuji97},
cites = {0},
citedby = {0},
pages = {174},
booktitle = {6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan},
publisher = {IEEE Computer Society},
isbn = {0-8186-8209-4},
}