Vinay Kumar, Nikhil Puri, Sudhir Kumar, Sumit Srivastav. A Sub-0.5V Reliability Aware-Negative Bitline Write-Assisted 8T DP-SRAM and WL Strapping Novel Architecture to Counter Dual Patterning Issues in 10nm FinFET. In 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, VLSID 2017, Hyderabad, India, January 7-11, 2017. pages 269-274, IEEE Computer Society, 2017. [doi]
Abstract is missing.