Testing and Defect Tolerance: A Rent s Rule Based Analysis and Implications on Nanoelectronics - researchr publication authors

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Arvind Kumar, Sandip Tiwari. Testing and Defect Tolerance: A Rent s Rule Based Analysis and Implications on Nanoelectronics. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 280-288, IEEE Computer Society, 2004. [doi]

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