Arvind Kumar, Sandip Tiwari. Testing and Defect Tolerance: A Rent s Rule Based Analysis and Implications on Nanoelectronics. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 280-288, IEEE Computer Society, 2004. [doi]
@inproceedings{KumarT04,
title = {Testing and Defect Tolerance: A Rent s Rule Based Analysis and Implications on Nanoelectronics},
author = {Arvind Kumar and Sandip Tiwari},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/dft/2004/2241/00/22410280abs.htm},
tags = {rule-based, testing, analysis, rules},
researchr = {https://researchr.org/publication/KumarT04},
cites = {0},
citedby = {0},
pages = {280-288},
booktitle = {19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-2241-6},
}