Arvind Kumar, Sandip Tiwari. Testing and Defect Tolerance: A Rent s Rule Based Analysis and Implications on Nanoelectronics. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 280-288, IEEE Computer Society, 2004. [doi]
Abstract is missing.