Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption - researchr publication authors

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Subhadip Kundu, S. Krishna Kumar, Santanu Chattopadhyay. Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 307-312, IEEE Computer Society, 2009. [doi]

This author has not been identified. Look up 'Subhadip Kundu' in GoogleThis author has not been identified. Look up 'S. Krishna Kumar' in GoogleThis author has not been identified. Look up 'Santanu Chattopadhyay' in Google

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