Subhadip Kundu, S. Krishna Kumar, Santanu Chattopadhyay. Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 307-312, IEEE Computer Society, 2009. [doi]
@inproceedings{KunduKC09, title = {Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption}, author = {Subhadip Kundu and S. Krishna Kumar and Santanu Chattopadhyay}, year = {2009}, doi = {10.1109/ATS.2009.35}, url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.35}, tags = {power consumption, testing}, researchr = {https://researchr.org/publication/KunduKC09}, cites = {0}, citedby = {0}, pages = {307-312}, booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan}, publisher = {IEEE Computer Society}, isbn = {978-0-7695-3864-8}, }