A Metric for Test Set Characterization and Customization Toward Fault Diagnosis - researchr publication authors

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Subhadip Kundu, Sankhadeep Pal, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur. A Metric for Test Set Characterization and Customization Toward Fault Diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(11):1824-1828, 2013. [doi]

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