Subhadip Kundu, Sankhadeep Pal, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur. A Metric for Test Set Characterization and Customization Toward Fault Diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(11):1824-1828, 2013. [doi]
@article{KunduPCSK13,
title = {A Metric for Test Set Characterization and Customization Toward Fault Diagnosis},
author = {Subhadip Kundu and Sankhadeep Pal and Santanu Chattopadhyay and Indranil Sengupta and Rohit Kapur},
year = {2013},
doi = {10.1109/TCAD.2013.2272538},
url = {http://dx.doi.org/10.1109/TCAD.2013.2272538},
researchr = {https://researchr.org/publication/KunduPCSK13},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {32},
number = {11},
pages = {1824-1828},
}