Spatial correlation modeling for probe test cost reduction in RF devices - researchr publication authors

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Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris. Spatial correlation modeling for probe test cost reduction in RF devices. In 2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012. pages 23-29, IEEE, 2012. [doi]

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