Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris. Spatial correlation modeling for probe test cost reduction in RF devices. In 2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012. pages 23-29, IEEE, 2012. [doi]
@inproceedings{KuppHCM12,
title = {Spatial correlation modeling for probe test cost reduction in RF devices},
author = {Nathan Kupp and Ke Huang and John M. Carulli Jr. and Yiorgos Makris},
year = {2012},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6386584},
researchr = {https://researchr.org/publication/KuppHCM12},
cites = {0},
citedby = {0},
pages = {23-29},
booktitle = {2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012},
publisher = {IEEE},
}