Jaehun Lee, Youngcheon Jeong, Kyongsik Yeom, Changmin Jeon, Jongsung Woo, Sangjin Lee, Ga Young Lee, Dong-Hwee Hwang, Yong Seok Chung, Minji Seo, Dong-hyun Kim, DalHwan Kim, Yongsik Kim, HyunChang Lee, Soomin Cho, Myeonghee Oh, Hyun-Jin Shin, Gun Rae Kim, Sungyoung Yoon, Yong Kyu Lee, Young-Ki Hong. Highly Reliable 28nm Embedded Flash Process Development for High-Density and High-Speed Automotive Grade-1 Application. In IEEE International Memory Workshop, IMW 2021, Dresden, Germany, May 16-19, 2021. pages 1-3, IEEE, 2021. [doi]
Abstract is missing.