A 1.2 V 8 Gb 8-Channel 128 GB/s High-Bandwidth Memory (HBM) Stacked DRAM With Effective I/O Test Circuits - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Dong Uk Lee, Kyung-whan Kim, Kwan-Weon Kim, Kang Seol Lee, Sang Jin Byeon, Jae-Hwan Kim, Jin-Hee Cho, Jaejin Lee, Jun Hyun Chun. A 1.2 V 8 Gb 8-Channel 128 GB/s High-Bandwidth Memory (HBM) Stacked DRAM With Effective I/O Test Circuits. J. Solid-State Circuits, 50(1):191-203, 2015. [doi]

This author has not been identified. Look up 'Dong Uk Lee' in GoogleThis author has not been identified. Look up 'Kyung-whan Kim' in GoogleThis author has not been identified. Look up 'Kwan-Weon Kim' in GoogleThis author has not been identified. Look up 'Kang Seol Lee' in GoogleThis author has not been identified. Look up 'Sang Jin Byeon' in GoogleThis author has not been identified. Look up 'Jae-Hwan Kim' in GoogleThis author has not been identified. Look up 'Jin-Hee Cho' in GoogleThis author has not been identified. Look up 'Jaejin Lee' in GoogleThis author has not been identified. Look up 'Jun Hyun Chun' in Google

runs on WebDSL