Dong Uk Lee, Kyung-whan Kim, Kwan-Weon Kim, Kang Seol Lee, Sang Jin Byeon, Jae-Hwan Kim, Jin-Hee Cho, Jaejin Lee, Jun Hyun Chun. A 1.2 V 8 Gb 8-Channel 128 GB/s High-Bandwidth Memory (HBM) Stacked DRAM With Effective I/O Test Circuits. J. Solid-State Circuits, 50(1):191-203, 2015. [doi]
@article{LeeKKLBKCLC15,
title = {A 1.2 V 8 Gb 8-Channel 128 GB/s High-Bandwidth Memory (HBM) Stacked DRAM With Effective I/O Test Circuits},
author = {Dong Uk Lee and Kyung-whan Kim and Kwan-Weon Kim and Kang Seol Lee and Sang Jin Byeon and Jae-Hwan Kim and Jin-Hee Cho and Jaejin Lee and Jun Hyun Chun},
year = {2015},
doi = {10.1109/JSSC.2014.2360379},
url = {http://dx.doi.org/10.1109/JSSC.2014.2360379},
researchr = {https://researchr.org/publication/LeeKKLBKCLC15},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {50},
number = {1},
pages = {191-203},
}