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FAME: Fault Address Memory Structure for Repair Time Reduction

Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Seung-Ho Shin, Sungho Kang. FAME: Fault Address Memory Structure for Repair Time Reduction. In 19th International SoC Design Conference, ISOCC 2022, Gangneung-si, Republic of Korea, October 19-22, 2022. pages 31-32, IEEE, 2022. [doi]

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Hayoung Lee

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Sooryeong Lee

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Younwoo Yoo

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Seung-Ho Shin

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Sungho Kang

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