Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Seung-Ho Shin, Sungho Kang. FAME: Fault Address Memory Structure for Repair Time Reduction. In 19th International SoC Design Conference, ISOCC 2022, Gangneung-si, Republic of Korea, October 19-22, 2022. pages 31-32, IEEE, 2022. [doi]
@inproceedings{LeeLYSK22a,
title = {FAME: Fault Address Memory Structure for Repair Time Reduction},
author = {Hayoung Lee and Sooryeong Lee and Younwoo Yoo and Seung-Ho Shin and Sungho Kang},
year = {2022},
doi = {10.1109/ISOCC56007.2022.10031369},
url = {https://doi.org/10.1109/ISOCC56007.2022.10031369},
researchr = {https://researchr.org/publication/LeeLYSK22a},
cites = {0},
citedby = {0},
pages = {31-32},
booktitle = {19th International SoC Design Conference, ISOCC 2022, Gangneung-si, Republic of Korea, October 19-22, 2022},
publisher = {IEEE},
isbn = {978-1-6654-5971-6},
}