Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Seung-Ho Shin, Sungho Kang. FAME: Fault Address Memory Structure for Repair Time Reduction. In 19th International SoC Design Conference, ISOCC 2022, Gangneung-si, Republic of Korea, October 19-22, 2022. pages 31-32, IEEE, 2022. [doi]
Abstract is missing.