Zhao Chuan Lee, M. Sultan M. Siddiqui, Zhi-Hui Kong, Tony Tae-Hyoung Kim. An 8T SRAM with BTI-Aware Stability Monitor and two-phase write operation for cell stability improvement in 28-nm FDSOI. In nd European Solid-State Circuits Conference, Lausanne, Switzerland, September 12-15, 2016. pages 437-440, IEEE, 2016. [doi]
No references recorded for this publication.
No citations of this publication recorded.