An Evaluation of X-Ray Irradiation Induced Dynamic Refresh Characterization in DRAM - researchr publication authors

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Kyungwoo Lee, Chae-Hyuk Yun, HyungAh Seo, Taehun Kang, Yunsung Lee, Kangyong Cho. An Evaluation of X-Ray Irradiation Induced Dynamic Refresh Characterization in DRAM. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-3, IEEE, 2019. [doi]

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