Kyungwoo Lee, Chae-Hyuk Yun, HyungAh Seo, Taehun Kang, Yunsung Lee, Kangyong Cho. An Evaluation of X-Ray Irradiation Induced Dynamic Refresh Characterization in DRAM. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-3, IEEE, 2019. [doi]
@inproceedings{LeeYSKLC19,
title = {An Evaluation of X-Ray Irradiation Induced Dynamic Refresh Characterization in DRAM},
author = {Kyungwoo Lee and Chae-Hyuk Yun and HyungAh Seo and Taehun Kang and Yunsung Lee and Kangyong Cho},
year = {2019},
doi = {10.1109/IRPS.2019.8720574},
url = {https://doi.org/10.1109/IRPS.2019.8720574},
researchr = {https://researchr.org/publication/LeeYSKLC19},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}