Kyungwoo Lee, Chae-Hyuk Yun, HyungAh Seo, Taehun Kang, Yunsung Lee, Kangyong Cho. An Evaluation of X-Ray Irradiation Induced Dynamic Refresh Characterization in DRAM. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-3, IEEE, 2019. [doi]
Abstract is missing.