Study on scalability of hybrid junctionless FinFET and multi-stacked nanowire FET by TCAD simulation - researchr publication authors

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ChengKuei Lee, Sen Yin, Jinyu Zhang, Yan Wang 0023, Zhiping Yu. Study on scalability of hybrid junctionless FinFET and multi-stacked nanowire FET by TCAD simulation. IEICE Electronic Express, 15(21):20180884, 2018. [doi]

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