ChengKuei Lee, Sen Yin, Jinyu Zhang, Yan Wang 0023, Zhiping Yu. Study on scalability of hybrid junctionless FinFET and multi-stacked nanowire FET by TCAD simulation. IEICE Electronic Express, 15(21):20180884, 2018. [doi]
@article{LeeYZWY18,
title = {Study on scalability of hybrid junctionless FinFET and multi-stacked nanowire FET by TCAD simulation},
author = {ChengKuei Lee and Sen Yin and Jinyu Zhang and Yan Wang 0023 and Zhiping Yu},
year = {2018},
doi = {10.1587/elex.15.20180884},
url = {https://doi.org/10.1587/elex.15.20180884},
researchr = {https://researchr.org/publication/LeeYZWY18},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {15},
number = {21},
pages = {20180884},
}