Hierarchical Test Program Development for Scan Testable Circuits - researchr publication authors

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Jens Leenstra, Lambert Spaanenburg. Hierarchical Test Program Development for Scan Testable Circuits. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 375-384, IEEE Computer Society, 1991.

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