Jens Leenstra, Lambert Spaanenburg. Hierarchical Test Program Development for Scan Testable Circuits. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 375-384, IEEE Computer Society, 1991.
@inproceedings{LeenstraS91,
title = {Hierarchical Test Program Development for Scan Testable Circuits},
author = {Jens Leenstra and Lambert Spaanenburg},
year = {1991},
tags = {testing},
researchr = {https://researchr.org/publication/LeenstraS91},
cites = {0},
citedby = {0},
pages = {375-384},
booktitle = {Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
publisher = {IEEE Computer Society},
isbn = {0-8186-9156-5},
}