Adaptive test method on production system-level testing (SLT) to optimize test cost, resources and defect parts per million (DPPM)

Subagaran Letchumanan, Terrence Huat Hin Tan, Yee Pheng Gan, Sai Leong Wong. Adaptive test method on production system-level testing (SLT) to optimize test cost, resources and defect parts per million (DPPM). In 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, Taiwan, April 16-19, 2018. pages 1-3, IEEE, 2018. [doi]

Authors

Subagaran Letchumanan

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Terrence Huat Hin Tan

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Yee Pheng Gan

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Sai Leong Wong

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