Subagaran Letchumanan, Terrence Huat Hin Tan, Yee Pheng Gan, Sai Leong Wong. Adaptive test method on production system-level testing (SLT) to optimize test cost, resources and defect parts per million (DPPM). In 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, Taiwan, April 16-19, 2018. pages 1-3, IEEE, 2018. [doi]
@inproceedings{LetchumananTGW18,
title = {Adaptive test method on production system-level testing (SLT) to optimize test cost, resources and defect parts per million (DPPM)},
author = {Subagaran Letchumanan and Terrence Huat Hin Tan and Yee Pheng Gan and Sai Leong Wong},
year = {2018},
doi = {10.1109/VLSI-DAT.2018.8373239},
url = {https://doi.org/10.1109/VLSI-DAT.2018.8373239},
researchr = {https://researchr.org/publication/LetchumananTGW18},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, Taiwan, April 16-19, 2018},
publisher = {IEEE},
isbn = {978-1-5386-4260-3},
}