Subagaran Letchumanan, Terrence Huat Hin Tan, Yee Pheng Gan, Sai Leong Wong. Adaptive test method on production system-level testing (SLT) to optimize test cost, resources and defect parts per million (DPPM). In 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, Taiwan, April 16-19, 2018. pages 1-3, IEEE, 2018. [doi]
Abstract is missing.