Testability, Debuggability, and Manufacturability Features of the UltraSPARC:::TM:::-I Microprocessor - researchr publication authors

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Marc E. Levitt, Srinivas Nori, Sridhar Narayanan, G. P. Grewal, Lynn Youngs, Anjali Jones, Greg Billus, Siva Paramanandam. Testability, Debuggability, and Manufacturability Features of the UltraSPARC:::TM:::-I Microprocessor. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 157-166, IEEE Computer Society, 1995.

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