Marc E. Levitt, Srinivas Nori, Sridhar Narayanan, G. P. Grewal, Lynn Youngs, Anjali Jones, Greg Billus, Siva Paramanandam. Testability, Debuggability, and Manufacturability Features of the UltraSPARC:::TM:::-I Microprocessor. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 157-166, IEEE Computer Society, 1995.
Abstract is missing.