Marc E. Levitt, Srinivas Nori, Sridhar Narayanan, G. P. Grewal, Lynn Youngs, Anjali Jones, Greg Billus, Siva Paramanandam. Testability, Debuggability, and Manufacturability Features of the UltraSPARC:::TM:::-I Microprocessor. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 157-166, IEEE Computer Society, 1995.
@inproceedings{LevittNNGYJBP95,
title = {Testability, Debuggability, and Manufacturability Features of the UltraSPARC:::TM:::-I Microprocessor},
author = {Marc E. Levitt and Srinivas Nori and Sridhar Narayanan and G. P. Grewal and Lynn Youngs and Anjali Jones and Greg Billus and Siva Paramanandam},
year = {1995},
tags = {testing, debugging},
researchr = {https://researchr.org/publication/LevittNNGYJBP95},
cites = {0},
citedby = {0},
pages = {157-166},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}