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Dean Lewis, Pascal Fouillat, Vincent Pouget. Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser. In 3rd Latin American Test Workshop, LATW 2002, Montevideo, Uruguay, February 10-13, 2002. pages 109-113, IEEE, 2002.
Possibly Related PublicationsThe following publications are possibly variants of this publication: Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADCVincent Pouget, Dean Lewis, Pascal Fouillat. tim, 53(4):1227-1231, 2004. [doi] Electrical modeling of the effect of beam profile for pulsed laser fault injectionC. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart. mr, 49(9-11):1143-1147, 2009. [doi]
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