Double cell upsets mitigation through triple modular redundancy - researchr publication authors

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Yuanqing Li, Anselm Breitenreiter, Marko S. Andjelkovic, Junchao Chen, Milan Babic, Milos Krstic. Double cell upsets mitigation through triple modular redundancy. Microelectronics Journal, 96:104683, 2020. [doi]

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