Yuanqing Li, Anselm Breitenreiter, Marko S. Andjelkovic, Junchao Chen, Milan Babic, Milos Krstic. Double cell upsets mitigation through triple modular redundancy. Microelectronics Journal, 96:104683, 2020. [doi]
@article{LiBACBK20,
title = {Double cell upsets mitigation through triple modular redundancy},
author = {Yuanqing Li and Anselm Breitenreiter and Marko S. Andjelkovic and Junchao Chen and Milan Babic and Milos Krstic},
year = {2020},
doi = {10.1016/j.mejo.2019.104683},
url = {https://doi.org/10.1016/j.mejo.2019.104683},
researchr = {https://researchr.org/publication/LiBACBK20},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {96},
pages = {104683},
}