A novel high performance 3×VDD-tolerant ESD detection circuit in advanced CMOS process - researchr publication authors

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Xiaoyun Li, Houpeng Chen, Yu Lei, Qian Wang, Xi Li, Jie Miao, Zhitang Song. A novel high performance 3×VDD-tolerant ESD detection circuit in advanced CMOS process. IEICE Electronic Express, 14(21):20170899, 2017. [doi]

This author has not been identified. Look up 'Xiaoyun Li' in GoogleThis author has not been identified. Look up 'Houpeng Chen' in GoogleThis author has not been identified. Look up 'Yu Lei' in GoogleThis author has not been identified. Look up 'Qian Wang' in GoogleThis author has not been identified. Look up 'Xi Li' in GoogleThis author has not been identified. Look up 'Jie Miao' in GoogleThis author has not been identified. Look up 'Zhitang Song' in Google

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