Xiaoyun Li, Houpeng Chen, Yu Lei, Qian Wang, Xi Li, Jie Miao, Zhitang Song. A novel high performance 3×VDD-tolerant ESD detection circuit in advanced CMOS process. IEICE Electronic Express, 14(21):20170899, 2017. [doi]
@article{LiCLWLMS17,
title = {A novel high performance 3×VDD-tolerant ESD detection circuit in advanced CMOS process},
author = {Xiaoyun Li and Houpeng Chen and Yu Lei and Qian Wang and Xi Li and Jie Miao and Zhitang Song},
year = {2017},
doi = {10.1587/elex.14.20170899},
url = {https://doi.org/10.1587/elex.14.20170899},
researchr = {https://researchr.org/publication/LiCLWLMS17},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {14},
number = {21},
pages = {20170899},
}