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A wear-leveling-aware dynamic stack for PCM memory in embedded systems

Qing'an Li, Yanxiang He, Yong Chen, Chun Jason Xue, Nan Jiang, Chao Xu. A wear-leveling-aware dynamic stack for PCM memory in embedded systems. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-4, IEEE, 2014. [doi]

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Qing'an Li

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Yanxiang He

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Yong Chen

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Chun Jason Xue

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Nan Jiang

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Chao Xu

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