Qing'an Li, Yanxiang He, Yong Chen, Chun Jason Xue, Nan Jiang, Chao Xu. A wear-leveling-aware dynamic stack for PCM memory in embedded systems. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-4, IEEE, 2014. [doi]
@inproceedings{LiHCXJX14,
title = {A wear-leveling-aware dynamic stack for PCM memory in embedded systems},
author = {Qing'an Li and Yanxiang He and Yong Chen and Chun Jason Xue and Nan Jiang and Chao Xu},
year = {2014},
doi = {10.7873/DATE2014.102},
url = {http://dx.doi.org/10.7873/DATE2014.102},
researchr = {https://researchr.org/publication/LiHCXJX14},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014},
publisher = {IEEE},
}