On capture power-aware test data compression for scan-based testing - researchr publication authors

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Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu. On capture power-aware test data compression for scan-based testing. In Sani R. Nassif, Jaijeet S. Roychowdhury, editors, 2008 International Conference on Computer-Aided Design (ICCAD 08), November 10-13, 2008, San Jose, CA, USA. pages 67-72, IEEE, 2008. [doi]

This author has not been identified. Look up 'Jia Li' in GoogleThis author has not been identified. Look up 'Xiao Liu' in GoogleThis author has not been identified. Look up 'Yubin Zhang' in GoogleThis author has not been identified. Look up 'Yu Hu' in GoogleThis author has not been identified. Look up 'Xiaowei Li' in GoogleThis author has not been identified. Look up 'Qiang Xu' in Google

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