On capture power-aware test data compression for scan-based testing

Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu. On capture power-aware test data compression for scan-based testing. In Sani R. Nassif, Jaijeet S. Roychowdhury, editors, 2008 International Conference on Computer-Aided Design (ICCAD 08), November 10-13, 2008, San Jose, CA, USA. pages 67-72, IEEE, 2008. [doi]

Abstract

Abstract is missing.