Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu. On capture power-aware test data compression for scan-based testing. In Sani R. Nassif, Jaijeet S. Roychowdhury, editors, 2008 International Conference on Computer-Aided Design (ICCAD 08), November 10-13, 2008, San Jose, CA, USA. pages 67-72, IEEE, 2008. [doi]
@inproceedings{LiLZHLX08,
title = {On capture power-aware test data compression for scan-based testing},
author = {Jia Li and Xiao Liu and Yubin Zhang and Yu Hu and Xiaowei Li and Qiang Xu},
year = {2008},
doi = {10.1145/1509456.1509482},
url = {http://doi.acm.org/10.1145/1509456.1509482},
tags = {rule-based, testing, data-flow, context-aware},
researchr = {https://researchr.org/publication/LiLZHLX08},
cites = {0},
citedby = {0},
pages = {67-72},
booktitle = {2008 International Conference on Computer-Aided Design (ICCAD 08), November 10-13, 2008, San Jose, CA, USA},
editor = {Sani R. Nassif and Jaijeet S. Roychowdhury},
publisher = {IEEE},
isbn = {978-1-4244-2820-5},
}