Investigation of Dynamic Leakage-Suppression Logic Techniques Crossing Different Technology Nodes from 180 nm Bulk CMOS to 7 nm FinFET Plus Process - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Jieyu Li, Zihan Lian, Hao Zhang, Weifeng He, Yanan Sun, Mingoo Seok. Investigation of Dynamic Leakage-Suppression Logic Techniques Crossing Different Technology Nodes from 180 nm Bulk CMOS to 7 nm FinFET Plus Process. In IEEE International Symposium on Circuits and Systems, ISCAS 2021, Daegu, South Korea, May 22-28, 2021. pages 1-5, IEEE, 2021. [doi]

This author has not been identified. Look up 'Jieyu Li' in GoogleThis author has not been identified. Look up 'Zihan Lian' in GoogleThis author has not been identified. Look up 'Hao Zhang' in GoogleThis author has not been identified. Look up 'Weifeng He' in GoogleThis author has not been identified. Look up 'Yanan Sun' in GoogleThis author has not been identified. Look up 'Mingoo Seok' in Google

runs on WebDSL