Investigation of Dynamic Leakage-Suppression Logic Techniques Crossing Different Technology Nodes from 180 nm Bulk CMOS to 7 nm FinFET Plus Process

Jieyu Li, Zihan Lian, Hao Zhang, Weifeng He, Yanan Sun, Mingoo Seok. Investigation of Dynamic Leakage-Suppression Logic Techniques Crossing Different Technology Nodes from 180 nm Bulk CMOS to 7 nm FinFET Plus Process. In IEEE International Symposium on Circuits and Systems, ISCAS 2021, Daegu, South Korea, May 22-28, 2021. pages 1-5, IEEE, 2021. [doi]

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