Methods for testing path delay and static faults in RSFQ circuits

Mingye Li, Fangzhou Wang, Sandeep K. Gupta. Methods for testing path delay and static faults in RSFQ circuits. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]

Abstract

Abstract is missing.