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Mingye Li, Fangzhou Wang, Sandeep K. Gupta. Methods for testing path delay and static faults in RSFQ circuits. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Simulator for At-Speed Robust Testing of Path Delay Faults in Combinational CircuitsYuan-Chieh Hsu, Sandeep K. Gupta. TC, 45(11):1312-1318, 1996.
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