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Jin-Fu Li, Cheng-Wen Wu, Cheng-Wen Wu, Masahiro Aoyagi, Meng-Fan Marvin Chang, Ding-Ming Kwai. Special session 4C: Hot topic 3D-IC design and test. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1, IEEE Computer Society, 2013. [doi]

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